The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2015

Filed:

Feb. 17, 2012
Applicant:

Hao-hao Wang, Shanghai, CN;

Inventor:

Hao-Hao Wang, Shanghai, CN;

Assignee:

INVENTEC CORPORATION, Taipei, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/173 (2006.01); H04L 12/24 (2006.01);
U.S. Cl.
CPC ...
H04L 41/04 (2013.01); H04L 41/0695 (2013.01);
Abstract

A method for monitoring a plurality of rack systems is provided, which includes the following steps. The rack systems are provided, in which each rack system includes an integrated management module (IMM) and a plurality of servers. The IMM is communicatively connected to the servers in each rack system and manages and controls the servers. The rack systems are distributed into at least one rack group, and one of the IMMs in each rack group is selected to serve as a primary IMM, in which the IMMs in each rack group are communicatively connected to each other. The primary IMM monitors other IMMs than the primary IMM in the corresponding rack group. When an anomaly occurs in one of the other IMMs, the primary IMM sends a warning message including the abnormal IMM.


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