The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2015

Filed:

Oct. 04, 2013
Applicant:

Realtek Semiconductor Corp., HsinChu, TW;

Inventor:

Ye Liu, Suzhou, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 7/00 (2006.01); H03K 5/01 (2006.01);
U.S. Cl.
CPC ...
H03K 5/01 (2013.01);
Abstract

An oversampling method for data signal includes oversampling data strobe signal and data signal according to sampling phases to generate first and second sampling results, performing edge detection on the first and second sampling results to obtain first and second edge positions where edges are detected, calculating and storing first offset according to the first edge position and the corresponding second edge position when the second edge position are obtained, using first offset obtain in a previous sampling cycle as the first offset in a current sampling cycle when the second edge position aren't obtained, calculating first sampling point according to the first edge position; calculating second sampling point according to the first sampling point and the corresponding first offset, and selecting and outputting the corresponding second sampling results according to the second sampling point.


Find Patent Forward Citations

Liu, Ye. (2015). Oversampling method for data signal and oversampling apparatus thereof (U.S. Patent No. 9118306). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9118306

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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