The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2015
Filed:
Apr. 02, 2013
Canon Kabushiki Kaisha, Tokyo, JP;
David Peter Morgan-Mar, Wollstonecraft, AU;
Kieran Gerard Larkin, Putney, AU;
Matthew Raphael Arnison, Umina Beach, AU;
Peter Alleine Fletcher, Rozelle, AU;
Tuan Quang Pham, Epping, AU;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
Methods for determining a depth measurement of a scene which involve capturing at least two images of the scene with different camera parameters, and selecting corresponding image patches in each scene. A first approach calculates a plurality of complex responses for each image patch using a plurality of different quadrature filters, each complex response having a magnitude and a phase, assigns, for each quadrature filter, a weighting to the complex responses in the corresponding image patches, the weighting being determined by a relationship of the phases of the complex responses, and determines the depth measurement of the scene from a combination of the weighted complex responses.