The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2015

Filed:

Oct. 17, 2005
Applicants:

Jeffrey Allen Cooper, Rocky Hill, NJ (US);

Joan Llach, Princeton, NJ (US);

Cristina Gomila, Princeton, NJ (US);

Inventors:

Jeffrey Allen Cooper, Rocky Hill, NJ (US);

Joan Llach, Princeton, NJ (US);

Cristina Gomila, Princeton, NJ (US);

Assignee:

Thomson Licensing, Boulogne-Billancourt, FR;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 11/02 (2006.01); H04N 11/04 (2006.01); H04N 7/12 (2006.01); H04B 1/66 (2006.01); G06T 5/00 (2006.01); H04N 19/46 (2014.01); H04N 19/44 (2014.01); H04N 19/467 (2014.01); H04N 19/423 (2014.01); H04N 19/85 (2014.01);
U.S. Cl.
CPC ...
G06T 5/002 (2013.01); H04N 19/423 (2014.11); H04N 19/44 (2014.11); H04N 19/46 (2014.11); H04N 19/467 (2014.11); H04N 19/85 (2014.11); G06T 2207/10016 (2013.01); G06T 2207/20204 (2013.01);
Abstract

The present invention provides methods for determining block averages in film grain simulation including determining block averages during a display process and determining block averages during a decoding process. The methods of the present invention exhibit different characteristics in terms of memory requirements and computational cost. More specifically, the first method uses no external memory, but requires either extra reads of the blocks, or internal memory in the display pipeline, while the second method requires extra memory bandwidth and extra external memory (e.g., RAM).


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