The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2015

Filed:

Dec. 08, 2010
Applicants:

Katsuhiko Mori, Kawasaki, JP;

Masami Kato, Sagamihara, JP;

Yoshinori Ito, Tokyo, JP;

Takahisa Yamamoto, Kawasaki, JP;

Inventors:

Katsuhiko Mori, Kawasaki, JP;

Masami Kato, Sagamihara, JP;

Yoshinori Ito, Tokyo, JP;

Takahisa Yamamoto, Kawasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/68 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00281 (2013.01);
Abstract

Even when a local area is varied, degradation in recognition accuracy and detection accuracy is suppressed. To that end, a pattern processing apparatus includes a reference local area setting portionfor setting a reference local area based on the detection result of a feature point by a face organ feature point detecting portion, a varied local area generating portionfor generating a plurality of varied local area patterns by referring to an image area near the reference local area, a similarity calculating portionfor calculating similarities in the reference local areas and in the varied local area patterns between the input pattern and the registered pattern, a representative similarity calculating portionfor calculating representative similarity from among the similarities, and a classifying portionfor determining a class to which the input pattern belongs.


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