The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2015
Filed:
Dec. 02, 2014
Applicant:
Texas Instruments Incorporated, Dallas, TX (US);
Inventors:
Goksel Dedeoglu, Plano, TX (US);
Vinay Sharma, Dallas, TX (US);
Assignee:
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00201 (2013.01); G06K 9/00771 (2013.01); G06K 9/6228 (2013.01);
Abstract
A method of analyzing a depth image in a digital system is provided that includes detecting a foreground object in a depth image, wherein the depth image is a top-down perspective of a scene, and performing data extraction and classification on the foreground object using depth information in the depth image.