The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2015

Filed:

Oct. 10, 2012
Applicant:

Fujitsu Limited, Kawasaki-shi, JP;

Inventor:

Koichi Shimizu, Kawasaki, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01); G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5018 (2013.01); G06F 2217/16 (2013.01);
Abstract

A magnetic property analyzing apparatus includes a first computing unit to perform a magnetic field analysis utilizing a FEM using an average magnetization given with respect to each of elements to which an analyzing target is segmented, and a second computing unit that computes an effective magnetic field acting on each element using a magnetic field computed by the magnetic field analysis, computes magnetization vectors within each element by obtaining a time integral of a LLG equation using the effective magnetic field, and computes an average magnetization for each element by averaging the magnetization vectors.


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