The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2015
Filed:
Jul. 05, 2012
Applicants:
Bradley Scott Denney, Irvine, CA (US);
Dariusz T. Dusberger, Irvine, CA (US);
Inventors:
Bradley Scott Denney, Irvine, CA (US);
Dariusz T. Dusberger, Irvine, CA (US);
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30707 (2013.01); G06F 17/30734 (2013.01);
Abstract
Systems and methods for measuring similarity between a set of clusters and a set of object labels, wherein at least two of the object labels are related, receive a first set of clusters, wherein the first set of clusters was formed by clustering objects in a set of objects into clusters of the first set of clusters according to a clustering procedure; and calculate a similarity index between the first set of clusters and a set of object labels based at least in part on a relationship between two or more object labels in the set of object labels.