The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2015

Filed:

Sep. 25, 2013
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventor:

Ryoichi Ueda, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/263 (2006.01); G06F 9/455 (2006.01);
U.S. Cl.
CPC ...
G06F 11/263 (2013.01); G06F 9/45533 (2013.01);
Abstract

An objective of the present invention is to efficiently perform a platform level test on a computer system comprising virtual machines that are automatically built according to predefined templates. A virtual machine test system according to the present invention creates a virtual machine according to a system template defining a combination of a network topology type of virtual machines and a role of each of the virtual machines, and performs a platform level test according to a test item defined for each of the combination (refer to FIG.).


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