The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2015
Filed:
Dec. 17, 2010
Kenneth L. Mcclamroch, Chapel Hill, NC (US);
Jennifer G. Becker, New Hill, NC (US);
Vindokumar Raghavan, Woburn, MA (US);
Peter Sun, Cambridge, MA (US);
Kenneth L. McClamroch, Chapel Hill, NC (US);
Jennifer G. Becker, New Hill, NC (US);
VindoKumar Raghavan, Woburn, MA (US);
Peter Sun, Cambridge, MA (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Embodiments of the present invention provide a system and computer program product for automated discovery and analysis of test management domain assets. The system includes a host server, a unified repository of test management artifact data, a plurality of crawlers disposed in the host server. Each crawler including a configuration of program code to crawl a remotely disposed repository of test management artifacts of a particular repository type in order to locate test management artifacts. A plurality of analyzers, each analyzer including a configuration of program code to parse test management artifacts of a particular repository type located by the crawlers into test management artifact data and to store the test management artifact data in the unified repository data. The system can also include a query interface to the unified repository through which queries are applied to the test management artifact data stored within the unified repository.