The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2015

Filed:

May. 01, 2014
Applicant:

Sharp Kabushiki Kaisha, Osaka, JP;

Inventors:

Nobuhiro Shirai, Osaka, JP;

Takaharu Motoyama, Osaka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G 15/04 (2006.01);
U.S. Cl.
CPC ...
G03G 15/04072 (2013.01);
Abstract

A light scanning device of the invention includes a scan deflection range of each of the light fluxes deflected by the deflecting part in a scan period of the scan object with the respective light fluxes is divided into a first deflection range where a reflection angle of each of the light fluxes with respect to the deflecting part is small and a second deflection range where the reflection angle is large. A polarization direction of each of the light fluxes is set such that a reflectivity of the reflective mirror when each of the light fluxes deflected in the second deflection range is reflected becomes larger than a reflectivity of the reflective mirror when each of the light fluxes deflected in the first deflection range is reflected.


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