The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2015

Filed:

Mar. 15, 2012
Applicants:

Tsung-yuan Chen, New Taipei, TW;

Kuei-chih Hou, New Taipei, TW;

Wen-kai Chiang, New Taipei, TW;

Inventors:

Tsung-Yuan Chen, New Taipei, TW;

Kuei-Chih Hou, New Taipei, TW;

Wen-Kai Chiang, New Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01); G01R 31/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/001 (2013.01); G01R 31/002 (2013.01);
Abstract

A voltage-drop testing system, including a voltage-drop control apparatus, and a voltage-drop testing method adapted for the voltage-drop testing system based on LABVIEW department platform. When the LABVIEW department platformis running, different groups of test data may be transferred to the PLD tester, when the PLD testerfinishes the testing based on all groups of test data, the PLD testerfeeds back the test results to the LABVIEW department platform, and the LABVIEW department platformcreates the voltage-drop testing graphic frame displaying the test results for the electronic device under testfor the convenience of a user.


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