The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2015

Filed:

Dec. 23, 2011
Applicants:

Andrew M. Owen, Lake Villa, IL (US);

Robert E. Shoulders, Santa Rosa, CA (US);

Inventors:

Andrew M. Owen, Lake Villa, IL (US);

Robert E. Shoulders, Santa Rosa, CA (US);

Assignee:

Keysight Technologies, Inc., Santa Rosa, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 23/20 (2006.01); G01R 29/26 (2006.01); G01R 27/28 (2006.01); G01R 27/32 (2006.01);
U.S. Cl.
CPC ...
G01R 29/26 (2013.01); G01R 27/28 (2013.01); G01R 27/32 (2013.01);
Abstract

A system has an extended dynamic range for measuring distortion in an output signal of a device under test (DUT), the output signal having at least a first fundamental signal. The system includes a first combiner and a test receiver. The first combiner is configured to inject a first cancellation signal generated by a first signal source into the output signal from the DUT, at least one of a first magnitude and a first phase of the first cancellation signal being adjustable for suppressing the first fundamental signal. The test receiver is configured to receive and measure the output signal having the suppressed first fundamental signal.


Find Patent Forward Citations

Loading…