The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2015

Filed:

Mar. 18, 2013
Applicant:

Electronics and Telecommunications Research Institute, Daejeon-si, KR;

Inventors:

Ae-Kyeung Moon, Daegu-si, KR;

Kyu-Hyung Kim, Daegu-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01N 33/00 (2006.01); G01N 21/3581 (2014.01);
U.S. Cl.
CPC ...
G01N 33/0098 (2013.01); G01N 21/3581 (2013.01);
Abstract

An apparatus and method for non-destructively diagnosing crop growth using terahertz waves are provided. The apparatus includes an information extractor configured to extract status information on a crop from information on an image of the crop taken using terahertz waves, a database configured to store growth-stage-specific information on the crop, and a status determiner configured to compare the status information on the crop extracted by the information extractor with the growth-stage-specific information stored in the database, and determine the degree of growth of the crop.


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