The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2015
Filed:
May. 11, 2012
Wen-wei Cheng, Tao-Yuan Hsien, TW;
Ming-kai Hsueh, Tao-Yuan Hsien, TW;
Wen-chi Lo, Tao-Yuan Hsien, TW;
Wen-Wei Cheng, Tao-Yuan Hsien, TW;
Ming-Kai Hsueh, Tao-Yuan Hsien, TW;
Wen-Chi Lo, Tao-Yuan Hsien, TW;
Chroma Ate, Inc., Tao-Yuan Hsien, TW;
Abstract
A surface pattern detecting method includes: capturing a surface image of a sample element to be detected, wherein the surface image containing N grayscale pixels and wherein the N is a positive integer; selecting f×N pixels with small grayscale value based on a selection ratio f in order to define a pattern zone and further calculating a pattern mean of the pattern zone based on pixel amount and grayscale value of the pattern zone; selecting f×N pixels with big grayscale value in order to define a background zone and further calculating a background mean of the background zone based on pixel amount and grayscale value of the background zone; and determining whether the surface image has a defect based on the pattern means of the pattern zone and the background mean of the background zone.