The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2015

Filed:

Nov. 16, 2010
Applicants:

Waled T. Hassan, Indianapolis, IN (US);

William J. Brindley, Hebron, CT (US);

Eric H. Jordan, Storrs, CT (US);

Michael W. Renfro, Manchester, CT (US);

Inventors:

Waled T. Hassan, Indianapolis, IN (US);

William J. Brindley, Hebron, CT (US);

Eric H. Jordan, Storrs, CT (US);

Michael W. Renfro, Manchester, CT (US);

Assignees:

Rolls-Royce Corporation, Indianapolis, IN (US);

The University of Connecticut, Farmington, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/30 (2006.01); G01N 21/71 (2006.01);
U.S. Cl.
CPC ...
G01N 21/718 (2013.01);
Abstract

Systems and techniques are disclosed for removing contaminants from a surface of a thermal barrier coating (TBC) and, optionally, estimating the remaining lifetime of the TBC. Laser induced breakdown spectroscopy (LIBS) is one method that may be used to remove contaminants from a surface the TBC prior to performing photo luminescence piezo spectroscopy (PLPS) or another spectroscopic technique on a thermally grown oxide (TGO). LIBS may facilitate monitoring substantially in real-time the chemical composition of the material removed. LIBS may be used to remove substantially only the contaminants with minimal effects on the underlying TBC. One technique for determining when to stop removal of material from the TBC is cross-correlation between a spectrum collected from the ablated material and a reference spectrum collected from a reference substrate. In some embodiments, the same system may be used to perform LIBS to remove impurities and PLPS to measure stress in the TGO.


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