The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2015

Filed:

Mar. 12, 2013
Applicants:

SO Yano, Ibaraki, JP;

Naotoshi Kawai, Toyokawa, JP;

Yoshiyuki Toso, Toyokawa, JP;

Noboru Oomoto, Toyokawa, JP;

Shoichi Yoshikawa, Okazaki, JP;

Takao Miyamoto, Nagoya, JP;

Inventors:

So Yano, Ibaraki, JP;

Naotoshi Kawai, Toyokawa, JP;

Yoshiyuki Toso, Toyokawa, JP;

Noboru Oomoto, Toyokawa, JP;

Shoichi Yoshikawa, Okazaki, JP;

Takao Miyamoto, Nagoya, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/55 (2014.01); G01N 21/57 (2006.01);
U.S. Cl.
CPC ...
G01N 21/57 (2013.01);
Abstract

A gloss measuring device that measures a gloss of an image formed on a sheet which is being transported, the gloss measuring device includes a light emission portion that emits light toward the sheet, a light reception portion that receives the light reflected specularly off the image formed on the sheet, and a position adjustment unit that performs adjustment such that the sheet being transported is in a measurement reference position.


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