The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2015

Filed:

Feb. 25, 2008
Applicant:

John Marius Rodenburg, Sheffield, GB;

Inventor:

John Marius Rodenburg, Sheffield, GB;

Assignee:

Phase Focus Limited, Sheffield, GB;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/47 (2006.01); A61B 6/00 (2006.01); A61B 8/00 (2006.01); G01N 23/225 (2006.01); G01N 23/04 (2006.01); G06T 11/00 (2006.01); G01N 21/49 (2006.01);
U.S. Cl.
CPC ...
G01N 21/4795 (2013.01); A61B 6/483 (2013.01); A61B 6/5205 (2013.01); A61B 8/00 (2013.01); G01N 21/4788 (2013.01); G01N 21/49 (2013.01); G01N 23/04 (2013.01); G01N 23/046 (2013.01); G01N 23/2251 (2013.01); G06T 11/003 (2013.01); A61B 6/466 (2013.01);
Abstract

A method and apparatus are disclosed for providing image data for constructing an image of a region of a three dimensional target object. The method includes the steps of providing incident radiation, via at least one detector detecting an intensity of radiation scattered by the target object, repositioning incident radiation relative to the target object, subsequently detecting the intensity of radiation scattered by the target object, determining a probe function indicating an estimate of at least one characteristic of the incident radiation at one or more depths of the object and providing image data from which an image of one or more regions of the object may be constructed via an iterative process using the probe function.


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