The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2015
Filed:
Jan. 20, 2012
Yung-lin Chen, Yunlin County, TW;
Hsin-yueh Sung, New Taipei, TW;
Chir-weei Chang, Taoyuan County, TW;
Yung-Lin Chen, Yunlin County, TW;
Hsin-Yueh Sung, New Taipei, TW;
Chir-Weei Chang, Taoyuan County, TW;
Industrial Technology Research Institute, Hsinchu, TW;
Abstract
An extended depth of field microscope system for phase object detection includes an imaging optical module and a phase/intensity converting module. The imaging optical module has an object lens group, in which an axial symmetric phase coding is added, to produce an axial symmetric spherical aberration. A point spread function (PSF) and an image with extended depth of field can be obtained with a predetermined level of similarity. The phase/intensity converting module converts the phase change of the light passing the phase object, into an image light with change of light intensity.