The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2015

Filed:

Jul. 04, 2011
Applicant:

Futoshi Hirose, Yokohama, JP;

Inventor:

Futoshi Hirose, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); A61B 3/10 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02011 (2013.01); A61B 3/102 (2013.01); A61B 5/0066 (2013.01); G01B 9/02027 (2013.01); G01B 9/02044 (2013.01); G01B 9/02091 (2013.01); G01B 2290/65 (2013.01); G01B 2290/70 (2013.01);
Abstract

An imaging apparatus adjusts the polarization directions of irradiation beams (to a diffraction grating) corresponding to first and second beams respectively which have different polarization directions (for example, by adjusting a relative angle formed between light-emitting ends of respective polarization maintaining fibers) so that the spectral characteristics of the irradiation beams at the diffraction grating coincide with each other. Then, the imaging apparatus acquires a tomographic image indicating polarization information for a object based on beams (that come from the diffraction grating for splitting and diffracting a beam from the adjustment unit) corresponding to the first and second beams respectively which have different polarization directions.


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