The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2015

Filed:

Oct. 12, 2012
Applicant:

Covidien Lp, Mansfield, MA (US);

Inventors:

Alexey Sharonov, Bethany, CT (US);

Candido Dionisio Pinto, Pacifica, CA (US);

Assignee:

Covidien LP, Mansfield, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/107 (2006.01); A61B 1/00 (2006.01); A61B 19/00 (2006.01); A61B 17/34 (2006.01);
U.S. Cl.
CPC ...
A61B 5/1076 (2013.01); A61B 1/00131 (2013.01); A61B 5/1079 (2013.01); A61B 19/46 (2013.01); A61B 17/3423 (2013.01); A61B 2019/461 (2013.01); A61B 2019/521 (2013.01);
Abstract

A metrology system includes a collinear array of uniformly spaced light elements for propagating parallel light beams. The parallel light beams assist in producing a light pattern on a target site. A method of measuring a dimension of a target site includes the steps of projecting uniformly spaced parallel light beams to form a light pattern having uniformly spaced elements on the target site, aligning the light pattern such that a maximum number of the uniformly spaced elements is positioned along the dimension; and counting the maximum number of the uniformly spaced elements positioned along the dimension.


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