The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2015
Filed:
Feb. 13, 2013
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventors:
Tsutomu Utagawa, Yokohama, JP;
Tomoyuki Makihira, Tokyo, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/00 (2006.01); A61B 3/10 (2006.01); A61B 3/12 (2006.01);
U.S. Cl.
CPC ...
A61B 3/1025 (2013.01); A61B 3/0008 (2013.01); A61B 3/12 (2013.01);
Abstract
In order to solve the problem in that, when a fundus is irradiated with multiple beams, a load has been placed on a subject, an imaging apparatus for imaging an object to be inspected based on return light from a first area in the object to be inspected, which is irradiated with first light, including: a determination unit for determining a second area being narrower than the first area in the object to be inspected; and a control unit for restricting the irradiation with the first light in the second area, which is irradiated with second light.