The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2015
Filed:
Jun. 18, 2013
Fujitsu Limited, Kanagawa, JP;
Jeng-Yuan Yang, Garland, TX (US);
Youichi Akasaka, Allen, TX (US);
Motoyoshi Sekiya, Richardson, TX (US);
Takuji Maeda, Kawasaki, JP;
Hiroki Ooi, Kawasaki, JP;
Satoru Okano, Yokohama, JP;
Fujitsu Limited, Kawasaki-shi, JP;
Abstract
The present disclosure includes a method of determining optical signal-to-noise ratio (OSNR) of a signal, comprising separating one polarization component from a plurality of polarization components in an optical signal, selecting one wavelength from a plurality of wavelengths in the optical signal, delaying a first portion of the one polarization component of the one wavelength of the optical signal, shifting a phase of the first portion by a first amount and the first amount plus pi radians, causing the first portion to interfere with a second portion, measuring a power of the interference of the first and second portions, receiving the power of the interference, and comparing the power of the interference when the phase is shifted by the first amount with the interference when the phase is shifted by the first amount plus pi radians to determine OSNR. The present disclosure also includes associated devices.