The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2015
Filed:
Feb. 14, 2011
Daniel Gariepy, Quebec, CA;
Gang He, Quebec, CA;
Daniel Gariepy, Quebec, CA;
Gang He, Quebec, CA;
EXFO INC., Quebec, CA;
Abstract
There is provided a method for determining an in-band noise parameter, such as the Optical Signal-to-Noise Ratio (OSNR), on an optical signal-under-test (SUT) propagating along an optical communication link and comprising a data-carrying signal contribution of any arbitrary degree of polarization and a noise contribution. A spectral shape trace of data-carrying signal contribution in the SUT is estimated using a reference optical spectrum trace of a reference signal which comprises a data-carrying signal contribution that is spectrally representative of the data-carrying signal contribution of the SUT and a noise contribution which is at least approximately known. The data-carrying signal contribution is mathematically discriminated from said noise contribution in the SUT using the spectral shape trace and the test optical spectrum trace. The in-band noise parameter is then determined at least from the mathematically discriminated noise contribution.