The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 18, 2015

Filed:

Jan. 26, 2011
Applicants:

Jianhong Mao, Shanghai, CN;

Fengqin Han, Shanghai, CN;

Inventors:

Jianhong Mao, Shanghai, CN;

Fengqin Han, Shanghai, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); H01L 29/772 (2006.01); H01L 21/28 (2006.01); H01L 29/51 (2006.01); H01L 29/78 (2006.01); H01L 29/66 (2006.01);
U.S. Cl.
CPC ...
H01L 29/7722 (2013.01); H01L 21/28176 (2013.01); H01L 29/51 (2013.01); H01L 29/66477 (2013.01); H01L 29/66545 (2013.01); H01L 29/66606 (2013.01); H01L 29/78 (2013.01);
Abstract

A MEMS device and a forming method thereof are provided. The MEMS device includes a semiconductor substrate with a well region formed therein. A source region, a drain region and a channel region are formed in the well region. The source region and the drain region are covered by an isolating layer, and the channel region is covered by a gate dielectric layer. The device further includes a gate electrode layer which is disposed above the gate dielectric layer, with a gap disposed therebetween. The width of the gap corresponds to the width of the channel region. The MEMS can work well at high voltages with less leakage current.


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