The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2015
Filed:
Jan. 17, 2013
Applicant:
Applied Nanotech Holdings, Inc., Austin, TX (US);
Inventors:
Alexei Tikhonski, Austin, TX (US);
Leif Thuesen, Austin, TX (US);
Assignee:
PEN Inc., Deerfield Beach, FL (US);
Primary Examiner:
Int. Cl.
CPC ...
G21K 5/00 (2006.01); H01J 49/10 (2006.01); H05H 1/24 (2006.01); H01J 49/02 (2006.01); G01N 27/62 (2006.01);
U.S. Cl.
CPC ...
H01J 49/10 (2013.01); H01J 49/022 (2013.01); H05H 1/2406 (2013.01); G01N 27/624 (2013.01); H05H 2001/2412 (2013.01); H05H 2245/121 (2013.01);
Abstract
System and method for operating an ionizer using a combination of amplitude modulation and pulse width modulation to control the plasma temperature and the type of ions needed for analytic equipment. Ion density can be controlled by the repetition rate. The ionizer may utilize a non-radioactive ionization source, and be coupled to a differential mobility spectroscopy (DMS) analyzer.