The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2015
Filed:
Sep. 17, 2013
Applicant:
Seiko Instruments Inc., Chiba-shi, Chiba, JP;
Inventors:
Kotaro Watanabe, Chiba, JP;
Makoto Mitani, Chiba, JP;
Assignee:
SEIKO INSTRUMENTS INC., Chiba, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 29/04 (2006.01); G11C 7/02 (2006.01); G11C 7/10 (2006.01);
U.S. Cl.
CPC ...
G11C 29/04 (2013.01); G11C 7/02 (2013.01); G11C 7/106 (2013.01); G11C 7/1063 (2013.01);
Abstract
Provided is a readout circuit capable of detecting inversion of retained data caused by a noise, such as static electricity. The readout circuit is configured to retain opposing data in a first latch circuit and a second latch circuit in a readout period so as to be capable of detecting an anomaly of the retained data by making use of the fact that the data in the first latch circuit and the second latch circuit are inverted in the same direction due to a noise, such as static electricity.