The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 18, 2015

Filed:

Apr. 24, 2013
Applicants:

Qualcomm Incorporated, San Diego, CA (US);

Industry-academic Cooperation Foundation, Yonsei University, Seoul, KR;

Inventors:

Seong-Ook Jung, Gyeongggi-Do, KR;

Younghwi Yang, Seoul, KR;

Bin Yang, San Diego, CA (US);

Zhongze Wang, San Diego, CA (US);

Choh fei Yeap, San Diego, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 11/00 (2006.01); G11C 11/412 (2006.01); G11C 11/419 (2006.01);
U.S. Cl.
CPC ...
G11C 11/412 (2013.01); G11C 11/419 (2013.01); Y10T 29/41 (2015.01);
Abstract

Static random access memories (SRAM) with read-preferred cell structures and write drivers are disclosed. In one embodiment, the SRAM has a six transistor bit cell. The read-preferred bit cell is implemented by providing two inverters, each having a pull up transistor, a pull down transistor and a pass gate transistor. Each pull up transistor is associated with a feedback loop. The feedback loop improves random static noise margin. Each transistor has a width and a length. The lengths of the pass gate transistors are increased. The widths of the pull down transistors are equal to one another and also equal to the widths of the pass gate transistors. The widths of the pass gate and pull down transistors may also be increased relative to prior designs. A write assist circuit may also be used to improve performance.


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