The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2015
Filed:
Nov. 22, 2011
Toshihiko Kaku, Kanagawa, JP;
Toshihiko Kaku, Kanagawa, JP;
FUJIFILM CORPORATION, Tokyo, JP;
Abstract
In an electronic endoscope system, a changed-area detector detects a changed area from an image captured by an endoscope, the changed area having different features from other area of the captured image. A mask data produce produces mask data based on the detected changed area, the mask data allocating an image processing parameter to each pixel of the captured image such that the changed area is processed in a different way from the other area. An image processor processes the captured image according to the mask data. Thus, an image area corresponding to an artificial object like a surgical tool may be detected as the changed area and excluded from unnecessary image processing.