The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2015
Filed:
Sep. 17, 2010
Andrew Janowczyk, East Meadow, NY (US);
Sharat Chandran, Mumbai, IN;
Anant Madabhushi, South Plainfield, NJ (US);
Andrew Janowczyk, East Meadow, NY (US);
Sharat Chandran, Mumbai, IN;
Anant Madabhushi, South Plainfield, NJ (US);
Rutgers, The State University of New Jersey, New Brunswick, NJ (US);
Abstract
A method and apparatus for obtaining segmented images of the stained regions may comprise quantifying the extent of the presence of staining of a biomarker in an original image of a sample, which may comprise selecting a domain swatch of data based upon a user specified domain knowledge; clustering the data within the original image by conducting a frequency weighted mean shift of the data within the original image to convergence, forming a hierarchical plurality of layers each having a different data resolution to form a hierarchical data pyramid; segmenting the plurality of mean shifted data images to determine in each mean shifted data image within the hierarchical data pyramid data not excluded as outside of the swatch; mapping the data not excluded as outside the swatch spatially back to the original image to create a final image; and, storing the final image on a storage medium for further analysis.