The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2015
Filed:
Dec. 13, 2012
Applicant:
Riverain Technologies, Llc, Miamisburg, OH (US);
Inventors:
Jason F. Knapp, Miamisburg, OH (US);
Steve W. Worrell, Springboro, OH (US);
Aarti Raheja, Centerville, OH (US);
Assignee:
Riverain Technologies, LLC, Miamisburg, OH (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/62 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/62 (2013.01); G06T 7/0081 (2013.01); G06T 7/0097 (2013.01); G06T 2207/10116 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20224 (2013.01); G06T 2207/30068 (2013.01);
Abstract
Image analysis techniques applicable to mammograms and other types of images may include image normalization, image segmentation, forming a prediction bias image, and creating an equalized image based on the prediction bias image. Creation of the equalized image may include subtraction of the prediction bias image from the original image. Forming the prediction bias image may involve the use of trained predictors.