The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 18, 2015

Filed:

Dec. 20, 2013
Applicants:

Nuctech Company Limited, Beijing, CN;

Tsinghua University, Beijing, CN;

Inventors:

Mingliang Li, Beijing, CN;

Zhiqiang Chen, Beijing, CN;

Yuanjing Li, Beijing, CN;

Li Zhang, Beijing, CN;

Assignees:

NUCTECH COMPANY LIMITED, Beijing, CN;

TSINGHUA UNIVERSITY, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00201 (2013.01); G06K 9/00771 (2013.01); G06K 2209/09 (2013.01);
Abstract

A three-dimensional data processing and recognizing method including scanning and re-constructing objects to be detected so as to obtain three-dimensional data for recognition of the objects to be detected; extracting data matching to features from the three-dimensional data, so that the extracted data constitutes an interested target; with respect to the data matching to features, merging and classifying adjacent data points as one group, to form an image of the merged interested target; recognizing a cross section of the interested target; cutting the interested targets by a perpendicular plane which passes through a central point of the cross section and is perpendicular to it, in order to obtain a graph; and recognizing shape of the interested targets based on a property of the graph.


Find Patent Forward Citations

Loading…