The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 18, 2015

Filed:

Oct. 26, 2012
Applicants:

Milind Torney, Pune, IN;

Sunil Mishra, San Francisco, CA (US);

Inventors:

Milind Torney, Pune, IN;

Sunil Mishra, San Francisco, CA (US);

Assignee:

Symantec Corporation, Mountain View, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/28 (2006.01); G06F 21/00 (2013.01); H04L 29/06 (2006.01);
U.S. Cl.
CPC ...
G06F 21/00 (2013.01); H04L 63/16 (2013.01);
Abstract

A method and apparatus for detection of DLP violations with language detection are described. A DLP product may monitor data content associated with the computing system, and identify a language of the data content. Based on the identified language, the DLP product identifies from among multiple DLP policies a first set of one or more DLP policies that are applicable for the identified language (referred to herein as language-specific DLP policies). The DLP product scans the data content using the first set to detect a violation of one of the DLP policies in the data content, and performs a DLP action in response to the detected violation.


Find Patent Forward Citations

Loading…