The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2015
Filed:
Aug. 21, 2013
Ca, Inc., Islandia, NY (US);
Srdjan Nalis, Prague, CZ;
Philippe Dubost, Prague, CZ;
CA, Inc., Islandia, NY (US);
Abstract
A computer-implemented method is disclosed in which locations of a plurality of Job Control Language (JCL) tests are obtained from a primary database supporting a software testing management platform. The locations the locations of the plurality of JCL tests are transmitted to a mainframe computing system (MCS) to initiate execution of the JCL tests. Based on transmitting the JCL test locations, execution IDs are retrieved for each of the plurality of JCL tests from the MCS. For each JCL test, the execution ID and an initial status of the JCL test are stored in the primary database. A query is transmitted to the MCS to determine an execution status of a given one of the JCL tests. Based on transmitting the query, a status update is received from the MCS for the JCL test, and the initial status of the JCL test in the primary database is selectively updated.