The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2015
Filed:
Jun. 22, 2012
Stephan Kraft, Belfast, GB;
Alin Jula, Mountain View, CA (US);
Giuliano Casale, Pavia, IT;
SAP SE, Walldorf, DE;
Abstract
Methods for performance evaluation of admission control policies (ACPs) include storing a simulation model including an admission queue and a finite capacity region (FCR), the admission queue admitting queries to the FCR based on an active ACP, the FCR modeling a resource constraint, generating traces, each trace being generated based on processing a single query using the database system, the single query being associated with a query type of a plurality of query types, for each query type, determining a query fork size and a service time from an associated trace to provide a plurality of tuples, each tuple being associated with a query type and including the fork size and the service time associated with the query type, parameterizing the simulation model based on the plurality of tuples, and for each of the ACPs, generating a performance parameter by applying a workload to the simulation model.