The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2015
Filed:
Nov. 12, 2013
Oracle International Corporation, Redwood Shores, CA (US);
Parul Jain, Sunnyvale, CA (US);
Vikram Shukla, Fremont, CA (US);
Anand Srinivasan, Bangalore, IN;
Alexandre de Castro Alves, Santa Clara, CA (US);
Eric Hsiao, San Mateo, CA (US);
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
The present invention includes a method for providing parameterized queries in complex event processing (CEP). The method includes providing a query template which includes one or more bind variables, providing sets of parameters corresponding to the one or more bind variables, and parsing the query template to determine positions of the one or more bind variables. The method further includes scanning the provided sets of parameters to determine which of the sets of parameters are to be bound to the one or more bind variables, binding the one or more bind variables which are determined to be bound to the sets of parameters, and substituting the bound one or more bind variables with the corresponding sets of parameters. The method further includes injecting all incarnations of the parameterized queries into the system, and one template/parameterized query is configured to run them all.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile