The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2015
Filed:
Dec. 20, 2012
Emc Corporation, Hopkinton, MA (US);
Mark Chamness, Menlo Park, CA (US);
Michael L. Federwisch, San Jose, CA (US);
EMC Corporation, Hopkinton, MA (US);
Abstract
Techniques for automatically detecting data replication performance degradation are described. According to one embodiment, a method starts with receiving periodically data replication characteristics from a source storage and a target storage, the data replication characteristics being extracted from a replication process of the source storage replicating data to the target storage. The received data replication characteristics are analyzed at a replication management server communicatively coupled with the source storage, and the target storage and data replication performance degradation is detected based on analyzing the received data replication characteristics and applying one or more rules of data replication performance degradation. When the one or more applied rules indicating that a data replication performance degradation has been detected, a notification is sent out.