The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 18, 2015

Filed:

Apr. 02, 2014
Applicant:

Lsi Corporation, San Jose, CA (US);

Inventors:

Weijun Tan, Longmont, CO (US);

Fan Zhang, Milpitas, CA (US);

Shaohua Yang, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2006.01); G11B 20/10 (2006.01); G11B 20/18 (2006.01);
U.S. Cl.
CPC ...
G06F 11/10 (2013.01); G11B 20/10009 (2013.01); G11B 20/10287 (2013.01); G11B 20/1816 (2013.01); G11B 20/1883 (2013.01); G11B 20/10296 (2013.01);
Abstract

Various embodiments of the present invention provide systems and methods for media defect detection. As an example, a method is discusses that includes: receiving a decoded output including a first multi-bit symbol; receiving a detected output including a second multi-bit bit symbol; calculating values based upon respective combinations of the first multi-bit symbol and the second multi-bit symbols; calculating a first product and the second product based upon some of the aforementioned values; and asserting a suspect symbol indicator indicating a probability that the symbol is incorrect when at least one of the first product and the second product is negative.


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