The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 18, 2015

Filed:

Apr. 01, 2010
Applicants:

Dongmei Zhang, Bellevue, WA (US);

Yingnong Dang, Beijing, CN;

Yingjun Qiu, Hangzhou, CN;

Song GE, Beijing, CN;

Inventors:

Dongmei Zhang, Bellevue, WA (US);

Yingnong Dang, Beijing, CN;

Yingjun Qiu, Hangzhou, CN;

Song Ge, Beijing, CN;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
G06F 8/751 (2013.01); G06F 8/71 (2013.01); G06F 8/75 (2013.01);
Abstract

Techniques for detecting, analyzing, and/or reporting code clone are described herein. In one or more implementations, clone-code detection is performed on one or more source code bases to find true and near clones of a subject code snippet that a user (e.g., a software developer) expressly or implicitly selected. In one or more other implementations, code clone is analyzed to estimate the code-improvement-potential (such as bug-potential and code-refactoring-potential) properties of clones. One or more other implementations present the results of code clone analysis with indications (e.g., rankings) of the estimated properties of the respective the clones.


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