The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 18, 2015

Filed:

Apr. 11, 2014
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Gautam Kapila, Richardson, TX (US);

Vijay Kumar Reddy, Plano, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/10 (2006.01); G01R 23/16 (2006.01); G01R 29/26 (2006.01);
U.S. Cl.
CPC ...
G01R 23/16 (2013.01); G01R 29/26 (2013.01);
Abstract

A method includes, for a device and at each of a plurality of sampling frequencies, measuring a parameter of the device to generate a plurality of signals and each signal represents a time series of values of the parameter. Further, the method includes for each of the plurality of signals, identifying at least two stable states in the time series for each signal. Still further, the method includes determining a time constant associated with each stable state of each signal, determining a relationship between the time constants of each stable state and sampling frequency, and computing a final time constant value for each steady state by computing a derivative of the time constants as a function of sampling frequency relationship and comparing the derivative to a threshold.


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