The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 18, 2015

Filed:

Mar. 21, 2012
Applicants:

Alfons Schulte, Orlando, FL (US);

Silki Arora, Orlando, FL (US);

Inventors:

Alfons Schulte, Orlando, FL (US);

Silki Arora, Orlando, FL (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/31 (2006.01);
U.S. Cl.
CPC ...
G01N 21/31 (2013.01); G01N 2201/08 (2013.01); G01N 2201/0866 (2013.01);
Abstract

Apparatus and method to measure optical absorption spectra with spatial resolution on the micron scale. An exemplary setup combines a continuous white light excitation beam in transmission geometry with a GRIN-based detection path in place of a typical confocal microscope. The apparatus and method enables the investigation of spatial variations in the optical density of small samples on the micron scale and the study of biological assemblies at the single cell level, leading to applications in optical diagnostics, microfluidics, cytology, and other areas.


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