The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2015
Filed:
Feb. 01, 2013
Daihan Cho, Yongin, KR;
Kyoungwoo Park, Yongin, KR;
Daihan Cho, Yongin, KR;
Kyoungwoo Park, Yongin, KR;
SAMSUNG DISPLAY CO., LTD., Yongin, Gyunggi-Do, KR;
Abstract
An impact absorption rate measuring apparatus includes a measuring unit configured to support an impact absorption member and to measure an impact absorption rate of the impact absorption member, an impact conversion member on the impact absorption member, the impact absorption member being stacked between the measuring unit and the impact conversion member, and a fall member configured to fall on an upper surface of the impact conversion member, the upper surface of the impact conversion member facing away from the impact absorption member.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile