The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2015
Filed:
Mar. 08, 2013
Essilor International (Compagnie Generale D'optique), Charenton le Pont, FR;
Stéphane Gueu, Charenton le Pont, FR;
Nicolas La Villonniere, Charenton le Pont, FR;
Fabien Muradore, Charenton le Pont, FR;
Asma Lakhoua, Charenton le Pont, FR;
ESSILOR INTERNATIONAL (COMPAGNIE GENERALE D'OPTIQUE), Charenton le Pont, FR;
Abstract
The subject of the present invention is a method and a system for measuring the geometric or optical structure of an optical component. In particular, the invention relates to a method for measuring the geometric structure of a component bounded by a first side () and a second side (), said method comprising steps of: (S) measuring a first signal (MS) resulting from a first conversion of a first probe signal (PS), by at least said first side (); (S) measuring a second signal (MS) resulting from a second conversion of a second probe signal (PS), by at least said second side (); (S) determining a third conversion making it possible to convert a first set of coordinates (R) associated with the measurement of the first signal (MS) to a second set of coordinates (R) associated with the measurement of the second signal (MS); (S) estimating said first side () using the first signal (MS), said first simulation and a first cost criterion (V) quantifying a difference between the estimation (FS) and the first signal (MS); and (S) estimating said second side () using the second signal (MS), said second simulation, said third conversion and a second cost criterion (V) quantifying a difference between the estimation (ES) and the second signal (MS).