The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2015
Filed:
Nov. 26, 2013
National Chiao Tung University, Hsinchu, TW;
National Chiao Tung University, Hsinchu, TW;
Abstract
A pressure and shear force measurement device and a pressure and shear force measurement method are disclosed. The measurement device includes a flexible substrate; a plurality of signal outputting units embedded in the flexible substrate for outputting signals; and a plurality of signal detectors disposed at a peripheral of the flexible substrate for receiving at least a signal outputted from the signal outputting units, wherein when the flexible substrate has a load applied thereon and each of the signal outputting units has a displacement, each of the signal detectors detects a pressure and a shear force resulting from the load on the flexible substrate based on the signal received from the signal outputting units.