The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 18, 2015

Filed:

Dec. 14, 2013
Applicant:

George Hsu, Boca Raton, FL (US);

Inventor:

George Hsu, Boca Raton, FL (US);

Assignee:

PNI Sensor Corporation, Santa Rosa, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 21/20 (2006.01); G01C 21/08 (2006.01); G01C 23/00 (2006.01); G01V 3/08 (2006.01); G01R 33/00 (2006.01); G01S 19/13 (2010.01); G01R 33/02 (2006.01); G01V 3/15 (2006.01); G01V 3/40 (2006.01); G01B 7/00 (2006.01); G01C 21/00 (2006.01); G01V 3/34 (2006.01); G01V 3/36 (2006.01); G01C 15/00 (2006.01); G01C 19/00 (2013.01);
U.S. Cl.
CPC ...
G01C 21/20 (2013.01); G01B 7/00 (2013.01); G01B 7/003 (2013.01); G01C 15/00 (2013.01); G01C 19/00 (2013.01); G01C 21/00 (2013.01); G01C 21/08 (2013.01); G01C 21/206 (2013.01); G01R 33/00 (2013.01); G01R 33/02 (2013.01); G01S 19/13 (2013.01); G01V 3/15 (2013.01); G01V 3/34 (2013.01); G01V 3/36 (2013.01); G01V 3/40 (2013.01); G01V 2210/142 (2013.01); G01V 2210/1425 (2013.01);
Abstract

Methods, apparatuses and systems of estimating a location of a device are disclosed. One method includes determining a first position of the device, sensing at least one magnetic anomaly at the first position, estimating a location of the magnetic anomaly relative to the first position by determining a plurality of magnetic properties of the magnetic anomaly based on sensed signals of at least a magnetic sensor, and estimating a second position of the device based on a sensed change in a distance from the magnetic anomaly to the device.


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