The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2015
Filed:
Mar. 08, 2013
Freescale Semiconductor, Inc., Austin, TX (US);
Deyou Fang, Chandler, AZ (US);
Keith L. Kraver, Gilbert, AZ (US);
Mark E. Schlarmann, Chandler, AZ (US);
FREESCALE SEMICONDUCTOR INC., Austin, TX (US);
Abstract
Systems and methods are provided for monitoring operation of MEMS gyroscopes (). A test signal generator () is configured to generate and apply a test signal to the rate feedback loop () of a MEMS gyroscope (). A test signal detector () is coupled to the quadrature feedback loop () of the MEMS gyroscope () and is configured to receive a quadrature output signal from the quadrature feedback loop (). The test signal detector () demodulates the quadrature output signal to detect effects of the test signal. Finally, the test signal detector () is configured to generate a monitor output indicative of the operation of the sensing device based at least in part on the detected effects of the test signal in the quadrature output signal. Thus, the system is able to provide for the continuous monitoring of the operation of the MEMS gyroscope ().