The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2015
Filed:
Sep. 06, 2011
Yusuke Hirao, Takatsuki, JP;
Yusuke Hirao, Takatsuki, JP;
KONICA MINOLTA, INC., Tokyo, JP;
Abstract
An interferometer () measures a measuring interference beam, while detecting the position of a moving mirror () on the basis of detection results obtained from a reference beam detector (). In the interferometer, a reference beam source () is configured by including a light source () composed of a semiconductor laser device. A reference optical system () has a collimating optical system () for a reference beam, said collimating optical system converting a laser beam outputted from the reference beam source () into a collimated beam, and the collimated beam is diagonally inputted to a fixed mirror ().
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile