The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2015
Filed:
Mar. 09, 2009
John F. Shakespeare, Hiltulanlahti, FI;
Tarja T. Shakespeare, Hiltulanlahti, FI;
Markku Kellomäki, Kuopio, FI;
John F. Shakespeare, Hiltulanlahti, FI;
Tarja T. Shakespeare, Hiltulanlahti, FI;
Markku Kellomäki, Kuopio, FI;
Honeywell International Inc., Morristown, NJ (US);
Abstract
A method includes receiving multiple biased measurements associated with a property of a sheet of material, where the biased measurements correspond to multiple known sheet geometries. The method also includes determining an unbiased measurement associated with the property of the sheet using the biased measurements, where the unbiased measurement corresponds to a nominal sheet geometry. The method further includes storing and/or outputting the unbiased measurement. Determining the unbiased measurement could include performing regression using the biased measurements and their corresponding sheet geometries to identify an estimated value of the property of the sheet at the nominal sheet geometry. The biased measurements can be generated using one or more sensors, and the sheet may not be stabilized during the biased measurement generation. Additional sheet geometries can also be created, such as by varying a tilt angle, a curvature, and/or a position of the sheet.