The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2015
Filed:
Apr. 10, 2014
Applicant:
Xerox Corporation, Norwalk, CT (US);
Inventors:
Robert P. Herloski, Webster, NY (US);
Thomas R. Race, Rochester, NY (US);
Assignee:
Xerox Corporation, Norwalk, CT (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 29/38 (2006.01); B41J 2/015 (2006.01); B41J 2/14 (2006.01); B41J 2/16 (2006.01); B29C 67/00 (2006.01); B41J 2/045 (2006.01); H04B 10/40 (2013.01);
U.S. Cl.
CPC ...
B29C 67/00 (2013.01); B41J 2/04501 (2013.01); B41J 2/14104 (2013.01); H04B 10/40 (2013.01);
Abstract
An apparatus detects defects in an object during three-dimensional printing of the object. The apparatus uses a terahertz sensor to generate data corresponding to the thickness of an object being formed at a plurality of locations on the surface of a layer of the object. These thickness data are compared to thickness data for locations of the corresponding layer from a previous build of the object. If a difference in thickness exceeds a predetermined threshold, a defect is detected.