The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2015
Filed:
May. 28, 2014
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventors:
Shuya Satoh, Yokohama, JP;
Hiroyuki Hashimoto, Yokohama, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 10/02 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
A61B 10/0266 (2013.01); A61B 5/0075 (2013.01); A61B 5/0086 (2013.01); A61B 5/6848 (2013.01); A61B 10/0275 (2013.01);
Abstract
A test apparatus includes a biopsy needle for sampling a biopsy specimen. The biopsy needle includes a specimen holder that holds the sampled biopsy specimen, and an optical window disposed in the specimen holder and configured to allow optical detection. A biopsy specimen held by the specimen holder of the test apparatus is measured by using a third-order nonlinear Raman microscope.